Quality Acceptance Standards for Gold Finger Chamfering Process
2025-06-16
1. BasIC Chamfer Parameters
| Item | Requirement | Inspection Method |
|---|---|---|
| Chamfer Angle | 30° or 45° (±2° tolerance) | Projector/Optical Profilometer |
| Chamfer Length | 0.2–0.5mm (±0.1mm tolerance) | Micrometer/Laser Scan |
| Symmetry | Bilateral length difference ≤0.05mm | CMM (Coordinate Measuring Machine) |
2. Cosmetic Defect Control
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Plating Integrity:
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No copper exposure or gold peeling (Au thickness ≥0.8μm, Ni underlayer 3–5μm).
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SCRatch depth ≤5μm (no visible cracks under 100× microscope).
-
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Edge Quality:
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Burr-free and chipping-free (smooth touch, fiber residue width <20μm).
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Smooth transition between chamfer and PCB suRFace (R-angle ≤0.1mm).
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3. Dimensional & Geometric Tolerances
| Key Item | Tolerance | Tool |
|---|---|---|
| Position Accuracy | ±0.15mm (relative to board edge) | 2D Image Measurer |
| Edge Perpendicularity | ≤0.1mm/100mm length | Square Gauge + Feeler Gauge |
| Coplanarity | Height variation ≤0.1mm across all fingers | Flatness Tester |
4. Functional Validation
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Insertion Durability:
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After 500 mating cycles, plating wear area <5%, contact resistance change ≤10%.
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Environmental Reliability:
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No plating cracks/delamination after thermal cycling (-40°C~+125°C, 100 cycles).
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Edge corrosion depth ≤3μm after salt spray test (96hrs, 5% NaCl).
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5. Process Defect Criteria
| Defect Type | Acceptance Criteria | Rejection Criteria |
|---|---|---|
| Angle Deviation | ≤±2° | >±3° or functional impairment |
| Plating Voids | Single void ≤0.1mm, ≤2 voids total | Exposed base material or continuous voids |
| Mechanical Damage | Chip depth ≤0.05mm | Causing impedance shift or short circuit |

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